Advanced theory of optical wave propagation and interferometric sensors for topography measurement
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Zusatztext
This manuscript provides a compendium for the application of the nonuniform wave model to standard problems of two beam interference and addresses common educational issues associated with wave propagation at attenuating interfaces. It also reports scientific advances in interferometric applications focusing on an interferometric point sensor with optical path length modulation and an areal measuring RGB-interferometer for fast topography measurements in the sub millisecond regime.
Weitere Details
Erschienen: 01.01.2014
Umfang: 180 S., 41 farbige Illustr.
Sprache: ENG
Einband: KT
Format: 1.1 x 21 x 14.8 cm
ISBN/EAN: 9783737608404
Umbreit-Nr.: 4093342
