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Reliability Technology for Integrated Circuit Packaging

Cover von Reliability Technology for Integrated Circuit Packaging

Zhou, Bin/En, Yunfei/Chen, Si

Springer Verlag GmbH

171.19

(inklusive MwSt.)

Verfügbarkeit: Besorgungstitel, Festbezug

Zusatztext

This book consists of ten chapters on IC packaging technologies, covering failure modes, mechanisms, advanced structures and reliability methods, with a focus on materials, structure and stress. Reliability, a key indicator of product quality, spans multiple disciplines such as materials science and electronics. In China's pursuit of "high-quality development" a focus on reliability is essential to advancing manufacturing. Written by a leading expert from the State Key Laboratory, this book is important for improving the performance of electronic products and supporting the growth of China's electronic information industry.

Weitere Details

Erschienen: 21.04.2026

Umfang: xxviii, 510 S., 222 s/w Illustr., 241 farbige Illu

Sprache: ENG

Einband: GEB

ISBN/EAN: 9789819538843

Umbreit-Nr.: 7642959

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